300nm Pitch High Resolution 2D Calibration Standard for SEM Fluid TappingMode Packaging:

Packaging:

Tip-evaluation software provides on-command "worst case" probe-shape diagnosis based on scanning of this roughness sample

Has two dots on one side for easy identification

and other electrical characterizationapplications

300nm Pitch High Resolution 2D Calibration Standard for SEM Fluid TappingMode Packaging:DESCRIPTION 300nm 2D SEM, Auger and FIB Reference Standard, Certified, Non traceable, Unmounted or Mounted Period: 300nm pitch nominal, two dimensional array accurate to 1nm. Calibration certificate will give the actual pitch of the standard. Surface Structure: Aluminum bumps on Silicon, 4x3mm die: Bump height (about 50nm) and width (about 150nm) not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable area