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Frequency Ratio Ft/Fo: 17
These probes have demonstrated highly repeatable deep (~100nm) indentations into materials such as fused silica and can image the indents at high resolution in-situ using the same probe
CAFM or SSRM DESCRIPTION
This part is included in the Electrostatic Force Microscopy (EFM) Option
RESP-20 FastScan Bio Frequency Ratio Ft/Fo: 170. 9N m, 20kHz, Symmetric Tip, No Coatings, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for contact mode imaging in air. Unmounted for use on standard AFM's. Bruker's flagship RESP probes are the preferred choice for high sensitivity silicon probe imaging in contact mode in air. Every aspect of the RESP design has been optimized to provide the most accurate profiling of microscopic
