Multi75DLC Pin Mount SEM Specimen Holders Pelcotec™ CDMS Critical Dimension Magnification

Pelcotec™ CDMS Critical Dimension Magnification Standard

Tip Geometry: Standard Tip Height: 10 - 15 Front Angle: 25+/-2 Back Angle: 15+/-2 Side Angle: 17

Width x Thickness 5029-2 Ceramic Tip Tweezer

Veeco"s SPM Calibration Gratings are designed specifically for three dimensional monitoring and calibration of scanning probe microscopes

Multi75DLC Pin Mount SEM Specimen Holders Pelcotec™ CDMS Critical Dimension MagnificationDiamond Like Carbon Coated Force Modulation AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Like Carbon Coated Force Modulation AFM Probe Monolithic silicon AFM probe for force modulation and pulsed force mode (PFM). High durability and hydrophobicity due to Diamond Like Carbon coating on tip side of the cantilever. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius