Pay in 4 interest-free payments of $428.65 Learn more
Ships within 48 hours · Estimated delivery Sep 29 - Oct 4
This probe is also available without Aluminum reflex coating as model NCHV
A pack of 10 High quality long-lever etched silicon probes for TappingMode™ and other non-contact modes
Bruker's robust Silicon Nitride AFM probes have soft Silicon Nitride cantilevers with Silicon Nitride tips
Center mark divides grid into 6 areas
MMEFCH TEM Grid Storage Boxes This probe is also availableElectric field cantilever holder DESCRIPTION TIP SPECIFICATIONS Electrostatic Force Microscopy (EFM) probe holder for the Multimode SPM. This stainless steel probe holder enables electric field gradient imaging for the MultiMode SPM. The holder provides electrical contact to the AFM tip through both the cantilever clip and the stainless steel cantilever pocket. An integrated piezo oscillates the tip for TappingMode. This holder can also be used for
US$ 40.00
US$ 36.00
US$ 9240.00
US$ 22.00
