All-In-One-DD SEM Magnification Standard and Stage Micrometer MRS-4 Markings for 30°

Markings for 30°

Other applications of the DDESP-V2 probe include: Scanning Capacitance Microscopy (SCM)

bent at 45 degrees 5/45 105mm NM-SS 0

Ø38mm x 6mm pin height

All-In-One-DD SEM Magnification Standard and Stage Micrometer MRS-4 Markings for 30°Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Diamond Coated, Conductive AFM Probe with 4 Different Cantilevers Versatile monolithic silicon AFM probe with 4 different cantilevers on a single AFM holder chip for various applications: contact mode, force modulation mode, soft tapping mode and high frequency tapping non contact mode and electric modes such as: scanning