FESPA-V2 Electrical High resolution electrical imaging with

High resolution electrical imaging with a sharp conductive tip

for an unprecedented level of high resolution and force control on samples in fluid

The coating on the back side of the cantilever compensatesfor the stress created by the front side coating and also enhances laserreflectivity by a factor of up to 2

This AFM probe is unmounted for use on any AFM and is also available without Aluminum reflex coating as model ESP-V2

FESPA-V2 Electrical High resolution electrical imaging with2. 8N m, 75kHz, 4 Sided Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for soft TappingMode imaging and force modulation in air. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular,FESP FESPA AFM probes. Brukers new line of FESP high quality premiumetched silicon probes set the industry standard for soft