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The nominal stress specification for NP probes is less than 4deg of cantilever bend
the ScanAsyst-Air-HPI-30 provides accurate nanomechanical mapping on very soft samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
these probes provide consistent results over many dozens of images
5 Cantilever Thickness (RNG): 5
APSH-0050 180 kHz The nominal stress specification forCP II sample bias holder DESCRIPTION Sample bias holder for CPII Innova has connectors to apply an external sample bias voltage. This type of sample holder is used to hold a flat sample, such as a piece of semiconductor material. The Sample Bias Holder is included in the Scanning Capacitance Microscopy (SCM) option.
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