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3mm 5050 ESD Safe
15430-3 - 45° Tilt Triple Specimen Holder for 3 Hitachi Mounts
Holds Hitachi M4 mounts secure on M4 screw adapters
CamScan) on standard Hitachi M4 thread
BSE Atomic Reference Specimen Dumont 70 3mm 5050 ESD SafeDESCRIPTION Back Scattered Electron Test Specimens An electron microscope, when equipped with a backscattered electron detector, has the capability to produce images in which the contrast is controlled by differences in atomic number (Z) across the specimen. Four reference specimens are now available that are suitable for testing the atomic number contrast performance of a backscattered electron detection system. Each of the reference specimens
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