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PELCO® Sample Clamp FIB Lift-Out Grids When placed on top of

SKU: 45055597995

4.7
USD186.70 USD231.70

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Ships within 48 hours · Estimated delivery Sep 22 - Sep 27

Description

When placed on top of a grid box

4x3mm dimensions

for Hitachi M4 mounts

JEOL or ISI/ABT/TOPCON

PELCO® Sample Clamp FIB Lift-Out Grids When placed on top ofDESCRIPTION PRODUCT SPECIFICATIONS PELCO Sample Clamps are clamping fixtures designed for microscopy sample preparation and sample mounting for metallographic samples, dimpled TEM samples, SEM specimens, and similar applications. The smallest size is suitable for smaller samples such as wedge polishing TEM cross sections. The larger single clamps are 2" wide by 3" tall and can accommodate samples up to 1. 25" (31mm) in height. It is ideal for mounting

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

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