ContGB-G Hitachi This quartz material is well

This quartz material is well documented and used in many microscopy applications

High purity vitreous carbon with impurities less than 30ppm total

PELCO Low Profile SEMClip™ Specimen Mounts

Tin on Carbon

ContGB-G Hitachi This quartz material is wellGold Coated Contact Mode AFM Probe DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Gold Coated Contact Mode AFM Probe Monolithic silicon AFM probe for contact mode and lateral force mode operation. The rotated tip allows for more symmetric representation of high sample features. The consistent tip radius ensures good resolution and reproducibility. The AFM holder chip fits most commercial AFM systems as it is industry standard size. Not