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- TERS probes for 633 nm or 785 nm excitation using STM feedback
for transmission electron microscopy
4 Sided Tip
the RTESPA-300-30 provides accurate nanomechanical mapping on stiff samples in air with controlled end radius and laser Doppler vibrometer calibrated spring constants
PELCO® AFM Disc Magnetic Pickup Tool Probe Supplies - TERS probes for 633DESCRIPTION The AFM STM discs are retrieved by using the convenient The AFM STM discs are retrieved by using the convenient PELCO AFM Disc Pickup Tool, comprised of a plastic handle, stainless steel shaft and a magnetic pad on the tip. Fingers need not touch the disc., comprised of a plastic handle, stainless steel shaft and a magnetic pad on the tip. Fingers need not touch the disc.
