SCM-PTSI 20 nm For a calibrated version of

For a calibrated version of this probe please see CLFC-NOBO

MLCT probes have less than 2deg of cantilever bend

The modulus of this sample and its variation over time are only approximately known

as encountered on semiconductor samples and optics

SCM-PTSI 20 nm For a calibrated version of2. 8N m, 75kHz, 4 Sided Tip, Conductive PtSi Coating DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS Bruker SCM PtSi Probes For the highest resolution nanoelectrical measurements with outstanding wear resistance. Bruker's new platinum silicide AFM probe is the ideal choice for Scanning Capacitance Microscopy measurements on the most advanced semiconductor features, providing the highest resolution imaging and long tip lifetime due to its