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145nm Pitch Calibration Standard for AFM 50 kHz Chromium adhesion layer thickness: 5nm

SKU: 69207346992

4.2
EUR841.00 EUR887.00

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Ships within 48 hours · Estimated delivery Sep 27 - Oct 2

Description

Chromium adhesion layer thickness: 5nm

Requires the CAFM module

two dimensional array accurate to ±1nm

3 MESP-LM-V2 probes

145nm Pitch Calibration Standard for AFM 50 kHz Chromium adhesion layer thickness: 5nmDESCRIPTION 145nm AFM Reference Standard, Certified, Non traceable, Mounted on disk: 145nm Very High Resolution AFM Reference Standard on 12mm steel disk 145nm AFM Reference Standard, Certified, Non traceable, Unmounted: 145nm Very High Resolution AFM Reference Standard, Unmounted Precision holographic pattern for accurate calibration for high resolution, nanometer scale measurements. Period: 145nm pitch nominal, one dimensional array. Accuracy is +

Exchange/Return Notes
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