Planotec Silicon Calibration Specimen - 10µm Pitch nominal 8nm 16205 (PDF)

16205 (PDF)

Will take notations

giving more precise results when surfaces are etched

DNP is recommended

Planotec Silicon Calibration Specimen - 10µm Pitch nominal 8nm 16205 (PDF)DESCRIPTION Useful for magnification calibration or image distortion check in SEM and LM. Single crystal silicon, 5mm x 5mm. The squares repeat every 10m (0. 01mm). The dividing lines are about 1. 9m wide, formed by electron beam lithography. A broader marking line is written every 500m (0. 5mm) which is useful for light microscopy. Lines are etched, and approximately 300nm deep. Available unmounted or mounted on SEM specimen mounts. A certificate of