PELCO® Grid Box for FIB Lift-Outs Unmounted Instrument Scanning electron microscopes have a

Scanning electron microscopes have a pattern that will show significant differences between backscattered and secondary electron type I and type II images

5mm at the bottom

Base is M4 threaded with short 6mm removable pin

"Interface characteristics of vertically aligned carbon nanofibers for interconnect applications"

PELCO® Grid Box for FIB Lift-Outs Unmounted Instrument Scanning electron microscopes have aDESCRIPTION Two part ESD safe box for holding FIB grids, half grids and processed lift outs. Grids are held in a specially shaped pocket that minimizes movement and protects the pins from contact with any surface. The insert lid ensures each grid is captured securely in the pocket. Box holds 100 grids. Pockets are locatable by labeled column (A K) and row (1 10). Small cutouts at the edges of the pockets allow easy access for tweezers for loading and