292nm Pitch High Magnification, High Resolution Calibration Standard for AFM Select:Non-traceable Bruker's SCM-PIT-V2 probe has a

Bruker's SCM-PIT-V2 probe has a Platinum-Iridium coated

5 Cantilever Geometry: Rectangular Cantilevers Number: 1 Front Side Coating: Conductive PtIr Back Side Coating: Reflective PtIr

Adapter MRS-3/4 only

Force Modulation cantilever holder DESCRIPTION

292nm Pitch High Magnification, High Resolution Calibration Standard for AFM Select:Non-traceable Bruker's SCM-PIT-V2 probe has aDESCRIPTION Precision holographic grating standard with high contrast and excellent edge definition. Period: 292nm pitch nominal, one dimensional array. Accuracy is + 1%. Calibration certificate will give the actual pitch of the standard. Surface structure: Titanium lines on Silicon, 4x3mm dimensions. Line height (about 30nm) and line width (130nm) are not calibrated. Usability: The calibrated pattern covers the entire chip. There is sufficient usable