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Scanning electron microscopes have a pattern that will show significant differences between backscattered and secondary electron type I and type II images
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Cantilever Material: Stainless Steel Cantilever Thickness (Nom): 13 Cantilever Thickness (RNG): 11 - 15 Cantilever Geometry: Rectangular Cantilevers Number: 11 - 31
PRODUCT SPECIFICATIONS
2000 lines/mm Cross Line Grating Replica Tweezers Scanning electron microscopes have aDESCRIPTION 677 AFM X Y Cross Line Grating Replica, 2000 lines mm, Cellulose Acetate, mounted on 12mm AFM STM Specimen Disc 677 AFM 10 X Y Cross Line Grating Replica, 2000 lines mm, Cellulose Acetate, mounted on 10mm AFM STM Specimen Disc 677 STM X Y Cross Line Grating Replica, 2000 lines mm, Carbon Au Pd Coated, mounted on 12mm AFM STM Specimen Disc 2,000 lines mm cross line grating replica is suitable for X Y calibration. The replicas have well
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