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Ships within 48 hours · Estimated delivery Sep 18 - Sep 23
Excess resin is removed
10nm Range
Electrostatic Force Microscopy (EFM) probe holder for the Multimode SPM
-- Seals cell against cover glass (EC-V2-CO VER GLASS) upon engage
Critical Dimension (CD) Calibration Test Specimens for SEM, FIB, and AFM AFM/STM Disks Excess resin is removedDESCRIPTION "Critical Dimension (CD) structures" are particularly useful for SEM FIB magnification calibration and may be used for AFM. Microscopists and engineers using high performance SEMs or FIB systems will find this calibration test specimen useful. The 4. 8 x 4. 8mm silicon standard has a series of patterns with a side length of 480m around its edges, helpful for orientation. There are three versions available. Version with a 10 5 2 1 0. 5um
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