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144nm Very High Resolution 2D Calibration Standard for SEM Mount:Mount B The second feature of this

SKU: 90774253895

4.5
USD1229.95 USD1268.95

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Description

The second feature of this product is in helping the microscopist get down to the nanoscale

Requires model UNIVECPOT bipotentiostat

These splash guards hold and seal the cantilever holder and seal on the end of a standard Dimension/BioScope SPM head

230x262 pitch

144nm Very High Resolution 2D Calibration Standard for SEM Mount:Mount B The second feature of thisDESCRIPTION Precision, holographic pattern providing accurate calibration in the horizontal plane for very high resolution, nanometer scale measurements with 144nm pitch. Period: 144nm pitch, two dimensional array. Accurate to 1nm. Refer to calibration certificate for actual pitch. Surface: Aluminum bumps on Silicon, 4x3mm die. Bump height (about 90nm) and width (about 75nm) are not calibrated. Usability: the calibrated pattern covers the entire chip.

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