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SPM cross-sectional sample holder DESCRIPTION
MultiMode SPM
making them easier to use and providing a much better seal than the previous circular cross-sectional rings
This AFM probe is unmounted for use on any AFM and is also available with Aluminum reflex coating as model FESPA-V2
FMV-PT 0.12 N/m SPM cross-sectional sample holder DESCRIPTION2. 8N m, 75kHz, Conductive PtIr Coating, PtIr Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of Conductive Silicon Probes. Bruker's Value Line Probe for Electrical Characterization with soft TappingMode or other "AC non contact modes." Specifications: Tip radius of 25 nm nominal. Platinum Iridium coated, electrically conductive tip that is ideal for various electrical characterization applications. The Pt Ir
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