RTESPA-300 80 nm The DDLTESP-V2 probe provides:

The DDLTESP-V2 probe provides:

Conductive PtIr Coating

The tip is designed to be ultra high strength and is fabricated by precision grinding of a solid diamond

Max W = 50 nm

RTESPA-300 80 nm The DDLTESP-V2 probe provides:40N m, 300kHz, Symmetric Tip, Al Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode andother non contact modes. Unmounted for use on standard AFM's. Bruker's flagship MPP probes are the preferred choice for high sensitivity silicon probe imaging in TappingMode or non contact mode in air. Every aspect of the MPP design has been optimized to provide the most