TESP-V2 2 nm -- REQUIRES one of the

-- REQUIRES one of the second generation Dimension Icon or Edge EC accessories (see model numbers above)

MultiMode SCM CANTILEVER HOLDER

This sample shown domains when imaged in SCM mode

Continuous imaging of the DNA double helix obtained while operating on an inverted optical microscope

TESP-V2 2 nm -- REQUIRES one of the37N m, 320kHz, No Reflex Coating, 10 Pack DESCRIPTION TIP SPECIFICATIONS CANTILEVER SPECIFICATIONS A pack of 10 High quality etched silicon probes for TappingMode and other non contact modes. Unmounted for use on standard AFM's. Bruker AFM Probes has introduced an improved version of its popular, TESP TESPA AFM probes. Brukers new line of TESP high quality premium etched silicon probes set the industry standard for TappingMode and non contact mode in